RK

Rainer Knippelmeyer

Applied Materials: 4 patents #83 of 946Top 9%
CG Carl Zeiss Microscopy Gmbh: 4 patents #5 of 128Top 4%
Overall (2016): #36,483 of 481,213Top 8%
4
Patents 2016

Issued Patents 2016

Patent #TitleCo-InventorsDate
9530613 Focusing a charged particle system Steven R. Rogers, Thomas Kemen, Stefan Schubert, Nissim Elmaliah 2016-12-27
9336981 Charged particle detection system and multi-beamlet inspection system 2016-05-10
9324537 Charged particle inspection method and charged particle system Thomas Kemen, Stefan Schubert 2016-04-26
9263233 Charged particle multi-beam inspection system and method of operating the same Dirk Zeidler, Thomas Kemen, Mario Muetzel, Stefan Schubert, Nissim Elmaliah +1 more 2016-02-16