Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7972969 | Method and apparatus for thinning a substrate | Ku-Feng Yang, Wen-Chih Chiou, Weng-Jin Wu | 2011-07-05 |
| 7974728 | System for extraction of key process parameters from fault detection classification to enable wafer prediction | Chun-Hsien Lin, Francis Ko, Henry Lo, Jean Wang | 2011-07-05 |