Issued Patents 2011
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8018260 | Compensation of degradation of performance of semiconductor devices by clock duty cycle adaptation | Vassilios Papageorgiou, Jan Hoentschel | 2011-09-13 |
| 7939399 | Semiconductor device having a strained semiconductor alloy concentration profile | Anthony Mowry, Bernhard Trui, Andreas Gehring, Andy Wei | 2011-05-10 |
| 7923338 | Increasing stress transfer efficiency in a transistor by reducing spacer width during the drain/source implantation sequence | Roman Boschke, Anthony Mowry | 2011-04-12 |
| 7897451 | Method for creating tensile strain by selectively applying stress memorization techniques to NMOS transistors | Casey Scott, Andreas Gehring, Peter Javorka, Andy Wei | 2011-03-01 |