Issued Patents 2011
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8058081 | Method of testing an integrity of a material layer in a semiconductor structure | Eckhard Langer, Frank Koschinsky | 2011-11-15 |
| 8058731 | Technique for forming metal lines in a semiconductor by adapting the temperature dependence of the line resistance | Matthias Lehr, Eckhard Langer | 2011-11-15 |
| 8039395 | Technique for forming embedded metal lines having increased resistance against stress-induced material transport | Hans-Juergen Engelmann, Ehrenfried Zschech, Peter Huebler | 2011-10-18 |