Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8056402 | Nanoprobe tip for advanced scanning probe microscopy comprising a layered probe material patterned by lithography and/or FIB techniques | Michael Hecker, Piotr Grabiec, Pawel Janus, Teodor Gotszalk | 2011-11-15 |
| 8039395 | Technique for forming embedded metal lines having increased resistance against stress-induced material transport | Moritz Andreas Meyer, Hans-Juergen Engelmann, Peter Huebler | 2011-10-18 |