Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8058081 | Method of testing an integrity of a material layer in a semiconductor structure | Moritz Andreas Meyer, Frank Koschinsky | 2011-11-15 |
| 8058731 | Technique for forming metal lines in a semiconductor by adapting the temperature dependence of the line resistance | Moritz Andreas Meyer, Matthias Lehr | 2011-11-15 |