Issued Patents 2005
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6960908 | Method for electrical testing of semiconductor package that detects socket defects in real time | Ae-Yong Chung, Jeong-Ho Bang, Kyeong-Seon Shin, Dae-Gab Chi | 2005-11-01 |
| 6922050 | Method for testing a remnant batch of semiconductor devices | Ae-Yong Chung, Jeong-Ho Bang, Kyeong-Seon Shin, Dae-Gab Chi | 2005-07-26 |
| 6903567 | Test apparatus having multiple test sites at one handler and its test method | Ae-Yong Chung, Kyeong-Seon Shin, Jeong-Ho Bang | 2005-06-07 |
| 6857090 | System and method for automatically analyzing and managing loss factors in test process of semiconductor integrated circuit devices | Kyu-Sung Lee, Ae-Yong Chung | 2005-02-15 |