Issued Patents 2005
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6960908 | Method for electrical testing of semiconductor package that detects socket defects in real time | Ae-Yong Chung, Sung-Ok Kim, Kyeong-Seon Shin, Dae-Gab Chi | 2005-11-01 |
| 6943577 | Multichip package test | Young-Gu Shin, Kyoung-Il Heo, Hyoung-Young Lee, Hyuk Kwon, Ki-Bong Ju +1 more | 2005-09-13 |
| 6922050 | Method for testing a remnant batch of semiconductor devices | Ae-Yong Chung, Sung-Ok Kim, Kyeong-Seon Shin, Dae-Gab Chi | 2005-07-26 |
| 6903567 | Test apparatus having multiple test sites at one handler and its test method | Ae-Yong Chung, Sung-Ok Kim, Kyeong-Seon Shin | 2005-06-07 |
| 6879541 | Integrated circuit with improved output control signal and method for generating improved output control signal | — | 2005-04-12 |
| 6861682 | Laser link structure capable of preventing an upper crack and broadening an energy window of a laser beam, and fuse box using the same | Kyeong-Seon Shin, Sang-Seok Kang, Ho-Jeong Choi, Hyen-wook Ju, Kwang-kyu Bang | 2005-03-01 |
| 6850450 | Fuse box including make-link and redundant address decoder having the same, and method for repairing defective memory cell | Kwang-kyu Bang, Kyeong-Seon Shin, Sang-Seok Kang, Hyen-wook Ju, Ho-Jeong Choi | 2005-02-01 |
| 6841425 | Wafer treatment method for protecting fuse box of semiconductor chip | Jae Il Lee, Young Moon LEE, Hyo-geun Chae | 2005-01-11 |
| 6842031 | Method of electrically testing semiconductor devices | Gil-Young Koh, Jong-Bok Tcho | 2005-01-11 |