Issued Patents 2005
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6972612 | Semiconductor device with malfunction control circuit and controlling method thereof | Sang-Seok Kang, Ki-Sang Kang | 2005-12-06 |
| 6960908 | Method for electrical testing of semiconductor package that detects socket defects in real time | Ae-Yong Chung, Sung-Ok Kim, Jeong-Ho Bang, Dae-Gab Chi | 2005-11-01 |
| 6922050 | Method for testing a remnant batch of semiconductor devices | Ae-Yong Chung, Sung-Ok Kim, Jeong-Ho Bang, Dae-Gab Chi | 2005-07-26 |
| 6903567 | Test apparatus having multiple test sites at one handler and its test method | Ae-Yong Chung, Sung-Ok Kim, Jeong-Ho Bang | 2005-06-07 |
| 6861682 | Laser link structure capable of preventing an upper crack and broadening an energy window of a laser beam, and fuse box using the same | Jeong-Ho Bang, Sang-Seok Kang, Ho-Jeong Choi, Hyen-wook Ju, Kwang-kyu Bang | 2005-03-01 |
| 6850450 | Fuse box including make-link and redundant address decoder having the same, and method for repairing defective memory cell | Kwang-kyu Bang, Sang-Seok Kang, Hyen-wook Ju, Jeong-Ho Bang, Ho-Jeong Choi | 2005-02-01 |