Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6960908 | Method for electrical testing of semiconductor package that detects socket defects in real time | Ae-Yong Chung, Sung-Ok Kim, Jeong-Ho Bang, Kyeong-Seon Shin | 2005-11-01 |
| 6922050 | Method for testing a remnant batch of semiconductor devices | Ae-Yong Chung, Sung-Ok Kim, Jeong-Ho Bang, Kyeong-Seon Shin | 2005-07-26 |