Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6979823 | Patterned wafer inspection method and apparatus therefor | Hiroyuki Shinada, Yusuke Yajima, Hisaya Murakoshi, Mari Nozoe, Atsuko Takafuji +4 more | 2005-12-27 |
| 6846593 | Negative electrode for non-aqueous electrolyte secondary battery and battery employing the same | Junichi Yamaura, Shuji Tsutsumi, Shinji Kasamatsu | 2005-01-25 |