Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6979823 | Patterned wafer inspection method and apparatus therefor | Hiroyuki Shinada, Hisaya Murakoshi, Masaki Hasegawa, Mari Nozoe, Atsuko Takafuji +4 more | 2005-12-27 |
| 6871314 | Forward error correcting code encoding equipment, forward error correcting code decoding equipment, and transmission apparatus | Masaki Ohira, Masatoshi Shibasaki, Takashi Mori | 2005-03-22 |