Issued Patents 2005
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6954916 | Methodology for fixing Qcrit at design timing impact | Kerry Bernstein, Philip G. Emma, Paul D. Kartschoke, Norman J. Rohrer | 2005-10-11 |
| 6931580 | Rapid fail analysis of embedded objects | Kevin J. Barcomb, Mark F. Olive, Kevin C. Quandt | 2005-08-16 |
| 6901542 | Internal cache for on chip test data storage | Thomas Bartenstein, L. Farnsworth, Douglas C. Heaberlin, Edward E. Horton, III, Leah Pastel +3 more | 2005-05-31 |
| 6880136 | Method to detect systematic defects in VLSI manufacturing | Maroun Kassab, Leah Pastel | 2005-04-12 |
| 6865501 | Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection | William V. Huott, Franco Motika, Leah Pfeifer Pastel | 2005-03-08 |