Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6901542 | Internal cache for on chip test data storage | Thomas Bartenstein, L. Farnsworth, Douglas C. Heaberlin, Edward E. Horton, III, Leendert M. Huisman +3 more | 2005-05-31 |
| 6880136 | Method to detect systematic defects in VLSI manufacturing | Leendert M. Huisman, Maroun Kassab | 2005-04-12 |