Issued Patents 2005
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6880136 | Method to detect systematic defects in VLSI manufacturing | Leendert M. Huisman, Leah Pastel | 2005-04-12 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6880136 | Method to detect systematic defects in VLSI manufacturing | Leendert M. Huisman, Leah Pastel | 2005-04-12 |