Issued Patents 2005
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6977514 | Probe structure | Ryuji Kohno, Tatsuya Nagata, Toshio Miyatake, Hideo Miura | 2005-12-20 |
| 6955870 | Method of manufacturing a semiconductor device | Ryuji Kohno, Hideo Miura, Masatoshi Kanamaru, Hideyuki Aoki | 2005-10-18 |
| 6952110 | Testing apparatus for carrying out inspection of a semiconductor device | Ryuji Kohno, Hideo Miura, Masatoshi Kanamaru, Hideyuki Aoki | 2005-10-04 |
| 6885208 | Semiconductor device and test device for same | Toshio Miyatake, Tatsuya Nagata, Ryuji Kohno, Hideyuki Aoki | 2005-04-26 |
| 6882039 | Semiconductor device | Asao Nishimura, Tosiho Miyamoto, Hideki Tanaka, Hideo Miura | 2005-04-19 |
| 6864568 | Packaging device for holding a plurality of semiconductor devices to be inspected | Ryuji Kohno, Masatoshi Kanamaru, Atsushi Hosogane, Toshio Miyatake, Hideo Miura +4 more | 2005-03-08 |
| 6864695 | Semiconductor device testing apparatus and semiconductor device manufacturing method using it | Ryuji Kohno, Hideo Miura, Masatoshi Kanamaru, Naoto Ban | 2005-03-08 |