Issued Patents 2005
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6977514 | Probe structure | Ryuji Kohno, Tatsuya Nagata, Hiroya Shimizu, Hideo Miura | 2005-12-20 |
| 6885208 | Semiconductor device and test device for same | Tatsuya Nagata, Hiroya Shimizu, Ryuji Kohno, Hideyuki Aoki | 2005-04-26 |
| 6864568 | Packaging device for holding a plurality of semiconductor devices to be inspected | Ryuji Kohno, Hiroya Shimizu, Masatoshi Kanamaru, Atsushi Hosogane, Hideo Miura +4 more | 2005-03-08 |