Issued Patents 2005
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6955870 | Method of manufacturing a semiconductor device | Ryuji Kohno, Hideo Miura, Hiroya Shimizu, Hideyuki Aoki | 2005-10-18 |
| 6952110 | Testing apparatus for carrying out inspection of a semiconductor device | Ryuji Kohno, Hideo Miura, Hiroya Shimizu, Hideyuki Aoki | 2005-10-04 |
| 6864568 | Packaging device for holding a plurality of semiconductor devices to be inspected | Ryuji Kohno, Hiroya Shimizu, Atsushi Hosogane, Toshio Miyatake, Hideo Miura +4 more | 2005-03-08 |
| 6864695 | Semiconductor device testing apparatus and semiconductor device manufacturing method using it | Ryuji Kohno, Hideo Miura, Hiroya Shimizu, Naoto Ban | 2005-03-08 |