Issued Patents 2005
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6971791 | Identifying defects in a conductive structure of a wafer, based on heat transfer therethrough | Ji-Ping Li | 2005-12-06 |
| 6963393 | Measurement of lateral diffusion of diffused layers | — | 2005-11-08 |
| 6958814 | Apparatus and method for measuring a property of a layer in a multilayered structure | Ji-Ping Li | 2005-10-25 |
| 6940592 | Calibration as well as measurement on the same workpiece during fabrication | Jiping Li, Jon Madsen | 2005-09-06 |
| 6911349 | Evaluating sidewall coverage in a semiconductor wafer | Jiping Li | 2005-06-28 |
| 6906801 | Measuring a property of a layer in multilayered structure | Jiping Li | 2005-06-14 |
| 6885458 | Apparatus and method for determining the active dopant profile in a semiconductor wafer | Regina G. Nijmeijer | 2005-04-26 |
| 6885444 | Evaluating a multi-layered structure for voids | Ji-Ping Li | 2005-04-26 |
| 6878559 | Measurement of lateral diffusion of diffused layers | G. Jonathan Kluth, Eric N. Paton | 2005-04-12 |