Issued Patents 2005
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6971791 | Identifying defects in a conductive structure of a wafer, based on heat transfer therethrough | Peter G. Borden | 2005-12-06 |
| 6958814 | Apparatus and method for measuring a property of a layer in a multilayered structure | Peter G. Borden | 2005-10-25 |
| 6885444 | Evaluating a multi-layered structure for voids | Peter G. Borden | 2005-04-26 |