SR

Steven P. Reeves

AM AMD: 3 patents #140 of 906Top 20%
🗺 Texas: #483 of 8,064 inventorsTop 6%
Overall (2005): #16,514 of 245,428Top 7%
3
Patents 2005

Issued Patents 2005

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
6933158 Method of monitoring anneal processes using scatterometry, and system for performing same Kevin R. Lensing, James Broc Stirton, Homi E. Nariman 2005-08-23
6927080 Structures for analyzing electromigration, and methods of using same Homi E. Nariman, James Broc Stirton, Kevin R. Lensing 2005-08-09
6881594 Method of using scatterometry for analysis of electromigration, and structures for performing same James Broc Stirton, Homi E. Nariman, Kevin R. Lensing 2005-04-19