Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6794203 | Method of calculating the real added defect counts | Kun Liu, Chun-Chieh Chen, Lien-Che Ho | 2004-09-21 |
| 6747105 | Bis-Schiff base ligand-containing mono-metallocene olefin polymerization catalyst, its preparation process and application | Yanlong Qian, Gang Zheng, Bing-Tson Lian, Jiling Huang | 2004-06-08 |
| 6684164 | True defect monitoring through repeating defect deletion | Kung-Yi Chen, Shu-Ling Ku, Mao-I Ting, Lien-Che Ho | 2004-01-27 |