SK

Shu-Ling Ku

MC Macronix International Co.: 1 patents #71 of 215Top 35%
Overall (2004): #116,439 of 270,089Top 45%
1
Patents 2004

Issued Patents 2004

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6684164 True defect monitoring through repeating defect deletion Kung-Yi Chen, Wei-Ming Chen, Mao-I Ting, Lien-Che Ho 2004-01-27