KC

Kung-Yi Chen

MC Macronix International Co.: 1 patents #71 of 215Top 35%
Overall (2004): #172,502 of 270,089Top 65%
1
Patents 2004

Issued Patents 2004

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6684164 True defect monitoring through repeating defect deletion Wei-Ming Chen, Shu-Ling Ku, Mao-I Ting, Lien-Che Ho 2004-01-27