Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6794203 | Method of calculating the real added defect counts | Wei-Ming Chen, Kun Liu, Chun-Chieh Chen | 2004-09-21 |
| 6773937 | Method of verifying a mask for a mask ROM | Ming-Yu Lin, Chiu-Hua Chung | 2004-08-10 |
| 6684164 | True defect monitoring through repeating defect deletion | Kung-Yi Chen, Wei-Ming Chen, Shu-Ling Ku, Mao-I Ting | 2004-01-27 |