KL

Kun Liu

MC Macronix International Co.: 1 patents #71 of 215Top 35%
Overall (2004): #172,156 of 270,089Top 65%
1
Patents 2004

Issued Patents 2004

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6794203 Method of calculating the real added defect counts Wei-Ming Chen, Chun-Chieh Chen, Lien-Che Ho 2004-09-21