Issued Patents 2004
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6828815 | Method and apparatus for defect analysis of semiconductor integrated circuit | Takahiro Yamaguchi, Yoshihiro Hashimoto | 2004-12-07 |
| 6821805 | Semiconductor device, semiconductor substrate, and manufacture method | Shinji Nakamura, Kenji Orita, Osamu Imafuji, Masaaki Yuri | 2004-11-23 |
| 6815726 | Semiconductor device and semiconductor substrate, and method of fabricating the same | Shinji Nakamura, Kenji Orita, Osamu Imafuji, Masaaki Yuri | 2004-11-09 |
| 6801049 | Method and apparatus for defect analysis of semiconductor integrated circuit | Takahiro Yamaguchi, Yoshihiro Hashimoto | 2004-10-05 |
| 6797991 | Nitride semiconductor device | — | 2004-09-28 |
| 6795496 | Jitter measuring device and method | Mani Soma, Takahiro Yamaguchi, Yasuo Furukawa, Toshifumi Watanabe | 2004-09-21 |
| 6775321 | Apparatus for and method of measuring a jitter | Mani Soma, Takahiro Yamaguchi, Toshifumi Watanabe | 2004-08-10 |
| 6773948 | Semiconductor light emitting device and method for producing the same | Shinji Nakamura, Masaaki Yuri, Osamu Imafuji, Kenji Orita | 2004-08-10 |
| 6750158 | Method for producing a semiconductor device | Masahiro Ogawa, Daisuke Ueda, Masaaki Yuri, Hirokazu Shimizu | 2004-06-15 |
| 6737852 | Clock skew measuring apparatus and method | Mani Soma, Takahiro Yamaguchi | 2004-05-18 |
| 6735538 | Apparatus and method for measuring quality measure of phase noise waveform | Takahiro Yamaguchi, Mani Soma | 2004-05-11 |
| 6723165 | Method for fabricating Group III nitride semiconductor substrate | Masahiro Ogawa, Satoshi Tamura, Shinichi Takigawa | 2004-04-20 |
| 6687629 | Apparatus for and method of measuring a jitter | Takahiro Yamaguchi, Mani Soma, Yasuo Furukawa, Toshifumi Watanabe | 2004-02-03 |
| 6673702 | Method for producing a semiconductor device | Kenzi Orita, Masaaki Yuri | 2004-01-06 |