Issued Patents 2004
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6828815 | Method and apparatus for defect analysis of semiconductor integrated circuit | Masahiro Ishida, Yoshihiro Hashimoto | 2004-12-07 |
| 6801049 | Method and apparatus for defect analysis of semiconductor integrated circuit | Masahiro Ishida, Yoshihiro Hashimoto | 2004-10-05 |
| 6795496 | Jitter measuring device and method | Mani Soma, Masahiro Ishida, Yasuo Furukawa, Toshifumi Watanabe | 2004-09-21 |
| 6783193 | Rotary pump and braking apparatus using rotary pump | Takashi Satou, Hiroyuki Shinkai | 2004-08-31 |
| 6775321 | Apparatus for and method of measuring a jitter | Mani Soma, Masahiro Ishida, Toshifumi Watanabe | 2004-08-10 |
| 6749272 | Rotary pump with higher discharge pressure and brake apparatus having same | Kazunori Uchiyama, Naoki Hakamada, Takashi Satou | 2004-06-15 |
| 6737852 | Clock skew measuring apparatus and method | Mani Soma, Masahiro Ishida | 2004-05-18 |
| 6735538 | Apparatus and method for measuring quality measure of phase noise waveform | Masahiro Ishida, Mani Soma | 2004-05-11 |
| 6715847 | Rotary pump with higher discharge pressure and brake apparatus having same | Tomoo Harada, Takashi Sato, Hiroshi Kondo, Toshihiko Kawamura | 2004-04-06 |
| 6687629 | Apparatus for and method of measuring a jitter | Mani Soma, Masahiro Ishida, Yasuo Furukawa, Toshifumi Watanabe | 2004-02-03 |