Issued Patents 2004
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6795496 | Jitter measuring device and method | Takahiro Yamaguchi, Masahiro Ishida, Yasuo Furukawa, Toshifumi Watanabe | 2004-09-21 |
| 6775321 | Apparatus for and method of measuring a jitter | Masahiro Ishida, Takahiro Yamaguchi, Toshifumi Watanabe | 2004-08-10 |
| 6737852 | Clock skew measuring apparatus and method | Masahiro Ishida, Takahiro Yamaguchi | 2004-05-18 |
| 6735538 | Apparatus and method for measuring quality measure of phase noise waveform | Takahiro Yamaguchi, Masahiro Ishida | 2004-05-11 |
| 6687629 | Apparatus for and method of measuring a jitter | Takahiro Yamaguchi, Masahiro Ishida, Yasuo Furukawa, Toshifumi Watanabe | 2004-02-03 |