YF

Yasuo Furukawa

AD Advantest: 3 patents #14 of 90Top 20%
UN Unknown: 1 patents #216 of 2,810Top 8%
📍 Tokyo, CA: #63 of 212 inventorsTop 30%
Overall (2004): #17,994 of 270,089Top 7%
3
Patents 2004

Issued Patents 2004

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
6795496 Jitter measuring device and method Mani Soma, Takahiro Yamaguchi, Masahiro Ishida, Toshifumi Watanabe 2004-09-21
6687629 Apparatus for and method of measuring a jitter Takahiro Yamaguchi, Mani Soma, Masahiro Ishida, Toshifumi Watanabe 2004-02-03
6687868 Test device and method for electrically testing electronic device Koji Asami 2004-02-03