Issued Patents 2004
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6828815 | Method and apparatus for defect analysis of semiconductor integrated circuit | Masahiro Ishida, Takahiro Yamaguchi | 2004-12-07 |
| 6801049 | Method and apparatus for defect analysis of semiconductor integrated circuit | Masahiro Ishida, Takahiro Yamaguchi | 2004-10-05 |
| 6781364 | Electron device testing apparatus having high current and low current testing features | Yoshitaka Kawasaki, Hironori Tanaka | 2004-08-24 |
| 6756774 | Constant voltage source, a constant voltage source circuit board and a method for applying a constant voltage | — | 2004-06-29 |