Issued Patents 2004
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6770907 | Test structure and methodology for semiconductor stress-induced defects and antifuse based on same test structure | Eric Adler, Jeffrey S. Brown, Robert J. Gauthier, Jr., Jonathan M. McKenna, Jed H. Rankin +2 more | 2004-08-03 |
| 6730552 | MOSFET with decoupled halo before extension | Jeffrey S. Brown, Kiran V. Chatty, Robert J. Gauthier, Jr., Carl Radens, William R. Tonti | 2004-05-04 |
| 6731179 | System and method for measuring circuit performance degradation due to PFET negative bias temperature instability (NBTI) | Wayne F. Ellis, Patrick R. Hansen, Jonathan M. McKenna | 2004-05-04 |
| 6714113 | Inductor for integrated circuits | Robert A. Groves, Patrick R. Hansen | 2004-03-30 |