Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6770907 | Test structure and methodology for semiconductor stress-induced defects and antifuse based on same test structure | Wagdi W. Abadeer, Eric Adler, Jeffrey S. Brown, Robert J. Gauthier, Jr., Jed H. Rankin +2 more | 2004-08-03 |
| 6731179 | System and method for measuring circuit performance degradation due to PFET negative bias temperature instability (NBTI) | Wagdi W. Abadeer, Wayne F. Ellis, Patrick R. Hansen | 2004-05-04 |