Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6731179 | System and method for measuring circuit performance degradation due to PFET negative bias temperature instability (NBTI) | Wagdi W. Abadeer, Wayne F. Ellis, Jonathan M. McKenna | 2004-05-04 |
| 6714113 | Inductor for integrated circuits | Wagdi W. Abadeer, Robert A. Groves | 2004-03-30 |