Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6770907 | Test structure and methodology for semiconductor stress-induced defects and antifuse based on same test structure | Wagdi W. Abadeer, Jeffrey S. Brown, Robert J. Gauthier, Jr., Jonathan M. McKenna, Jed H. Rankin +2 more | 2004-08-03 |
| 6750114 | One-mask metal-insulator-metal capacitor and method for forming same | Anthony K. Stamper | 2004-06-15 |
| 6683345 | Semiconductor device and method for making the device having an electrically modulated conduction channel | James S. Dunn, Joseph A. Iadanza, Jenifer E. Lary, Kent E. Morrett, Josef S. Watts | 2004-01-27 |