Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6828810 | Semiconductor device testing apparatus and method for manufacturing the same | Masatoshi Kanamaru, Yoshishige Endo, Takanori Aono, Ryuji Kohno, Naoto Ban +1 more | 2004-12-07 |
| 6784533 | Semiconductor device | Asao Nishimura, Tosiho Miyamoto, Hideki Tanaka, Hideo Miura | 2004-08-31 |