Issued Patents 2004
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6828810 | Semiconductor device testing apparatus and method for manufacturing the same | Masatoshi Kanamaru, Yoshishige Endo, Takanori Aono, Ryuji Kohno, Hiroya Shimizu +1 more | 2004-12-07 |
| 6774654 | Semiconductor-device inspecting apparatus and a method for manufacturing the same | Masatoshi Kanamaru, Yoshishige Endo, Takanorr Aono, Ryuji Kohno, Toshio Miyatake +1 more | 2004-08-10 |
| 6714030 | Semiconductor inspection apparatus | Ryuji Kohno, Hideo Miura, Yoshishige Endo, Masatoshi Kanamaru, Atsushi Hosogane +1 more | 2004-03-30 |
| 6696849 | Fabrication method of semiconductor integrated circuit device and its testing apparatus | Masaaki Namba, Akio Hasebe, Yuji Wada, Ryuji Kohno, Akira Seito +1 more | 2004-02-24 |