Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6828810 | Semiconductor device testing apparatus and method for manufacturing the same | Yoshishige Endo, Takanori Aono, Ryuji Kohno, Hiroya Shimizu, Naoto Ban +1 more | 2004-12-07 |
| 6774654 | Semiconductor-device inspecting apparatus and a method for manufacturing the same | Yoshishige Endo, Takanorr Aono, Ryuji Kohno, Toshio Miyatake, Hideyuki Aoki +1 more | 2004-08-10 |
| 6714030 | Semiconductor inspection apparatus | Ryuji Kohno, Hideo Miura, Yoshishige Endo, Atsushi Hosogane, Hideyuki Aoki +1 more | 2004-03-30 |