Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6804803 | Method for testing integrated logic circuits | Carl Barnhart, Robert W. Bassett, David E. Lackey, Mark R. Taylor, Donald L. Wheater | 2004-10-12 |
| 6782501 | System for reducing test data volume in the testing of logic products | Frank Distler, L. Farnsworth, Andrew Ferko, Bernd Koenemann | 2004-08-24 |
| 6708305 | Deterministic random LBIST | L. Farnsworth, Bernd Koenemann, Timothy J. Koprowski, Thomas J. Snethen, Donald L. Wheater | 2004-03-16 |