Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6804803 | Method for testing integrated logic circuits | Robert W. Bassett, Brion Keller, David E. Lackey, Mark R. Taylor, Donald L. Wheater | 2004-10-12 |
| 6795944 | Testing regularly structured logic circuits in integrated circuit devices | — | 2004-09-21 |