Issued Patents 2004
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6809808 | Wafer defect detection system with traveling lens multi-beam scanner | Haim Feldman, Emanuel Elyasaf, Nissim Elmaliach, Ron Naftali, Boris Golberg | 2004-10-26 |
| 6798505 | Method and apparatus for article inspection including speckle reduction | Avner Karpol, Emanuel Elyasaf, Shimon Yalov, Boaz Kenan | 2004-09-28 |
| 6791099 | Laser scanning wafer inspection using nonlinear optical phenomena | Daniel I. Some, Gilad Almogy | 2004-09-14 |
| 6788445 | Multi-beam polygon scanning system | Boris Goldberg | 2004-09-07 |