Issued Patents 2004
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6809808 | Wafer defect detection system with traveling lens multi-beam scanner | Haim Feldman, Emanuel Elyasaf, Ron Naftali, Boris Golberg, Silviu Reinhorn | 2004-10-26 |
NE
Nissim Elmaliach
Overall (2004): #146,447 of 270,089Top 55%
1
Patents 2004