Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6809808 | Wafer defect detection system with traveling lens multi-beam scanner | Haim Feldman, Nissim Elmaliach, Ron Naftali, Boris Golberg, Silviu Reinhorn | 2004-10-26 |
| 6798505 | Method and apparatus for article inspection including speckle reduction | Avner Karpol, Silviu Reinhorn, Shimon Yalov, Boaz Kenan | 2004-09-28 |