Issued Patents 2004
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6750447 | Calibration standard for high resolution electron microscopy | Erik Cho Houge, Catherine Vartuli, Fred Stevie | 2004-06-15 |
| 6727720 | Probe having a microstylet | Erik Cho Houge, Ryan Maynard, Larry E. Plew, Jeffrey B. Bindell | 2004-04-27 |
| 6714892 | Three dimensional reconstruction metrology | Erik Cho Houge, Larry E. Plew | 2004-03-30 |
| 6708574 | Abnormal photoresist line/space profile detection through signal processing of metrology waveform | Erik Cho Houge, Scott Jessen, Catherine Vartuli, Fred Stevie | 2004-03-23 |