Issued Patents 2003
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6620725 | Reduction of Cu line damage by two-step CMP | Shau-Lin Shue, Ming-Hsing Tsai, Ying-Ho Chen, Tsu Shih, Jih-Churng Twu +1 more | 2003-09-16 |
WT
Wen-Jye Tsai
Overall (2003): #93,597 of 273,478Top 35%
1
Patents 2003