Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6661912 | Inspecting method and apparatus for repeated micro-miniature patterns | Junichi Taguchi, Aritoshi Sugimoto, Yuko Inoue, Tetsuya Watanabe, Wakana Shinke | 2003-12-09 |
| 6542830 | Process control system | Fumio Mizuno, Seiji Isogai, Kenji Watanabe, Yasuhiro Yoshitake, Terushige Asakawa +12 more | 2003-04-01 |