Issued Patents 2003
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6660588 | High density floating gate flash memory and fabrication processes therefor | Nian Yang, Hyeon-Seag Kim | 2003-12-09 |
| 6646462 | Extraction of drain junction overlap with the gate and the channel length for ultra-small CMOS devices with ultra-thin gate oxides | Nian Yang, Xin Guo | 2003-11-11 |
| 6643185 | Method for repairing over-erasure of fast bits on floating gate memory devices | Nian Yang, Jiang Li | 2003-11-04 |
| 6642106 | Method for increasing core gain in flash memory device using strained silicon | Nian Yang, Hyeon-Seag Kim | 2003-11-04 |
| 6617639 | Use of high-K dielectric material for ONO and tunnel oxide to improve floating gate flash memory coupling | Xin Guo, Yue-Song He | 2003-09-09 |
| 6606273 | Methods and systems for flash memory tunnel oxide reliability testing | Xin Guo, Nian Yang | 2003-08-12 |
| 6596586 | Method of forming low resistance common source line for flash memory devices | Nian Yang, Un Soon Kim | 2003-07-22 |
| 6593590 | Test structure apparatus for measuring standby current in flash memory devices | Nian Yang, Tien-Chun Yang | 2003-07-15 |
| 6590260 | Memory device having improved programmability | Nian Yang, John Jianshi Wang | 2003-07-08 |
| 6576487 | Method to distinguish an STI outer edge current component with an STI normal current component | Harpreet Sachar, Kuo-Tung Chang | 2003-06-10 |
| 6570787 | Programming with floating source for low power, low leakage and high density flash memory devices | Nian Yang, Xin Guo | 2003-05-27 |
| 6541338 | Low defect density process for deep sub-0.18 &mgr;m flash memory technologies | Yue-Song He, Richard Fastow | 2003-04-01 |
| 6510085 | Method of channel hot electron programming for short channel NOR flash arrays | Richard Fastow, Sheunghee Park, Sameer Haddad, Chi Chang | 2003-01-21 |