Issued Patents 2003
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6668331 | Apparatus and method for successively generating an event to establish a total delay time that is greater than can be expressed by specified data bits in an event memory | Glen Gomes, Anthony Le, James Alan Turnquist, Rochit Rajusman | 2003-12-23 |
| 6651204 | Modular architecture for memory testing on event based test system | Rochit Rajsuman, Hiroaki Yamoto | 2003-11-18 |
| 6631340 | Application specific event based semiconductor memory test system | Koji Takahashi, Hiroaki Yamoto | 2003-10-07 |
| 6629282 | Module based flexible semiconductor test system | Rochit Rajsuman | 2003-09-30 |
| 6578169 | Data failure memory compaction for semiconductor test system | Anthony Le, Rochit Rajsuman, James Alan Turnquist | 2003-06-10 |
| 6567941 | Event based test system storing pin calibration data in non-volatile memory | James Alan Turnquist, Rochit Rajsuman | 2003-05-20 |
| 6545460 | Power source current measurement unit for semiconductor test system | — | 2003-04-08 |
| 6536006 | Event tester architecture for mixed signal testing | — | 2003-03-18 |
| 6532561 | Event based semiconductor test system | James Alan Turnquist, Rochit Rajsuman, Hiroaki Yamoto | 2003-03-11 |