Issued Patents 2003
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6668331 | Apparatus and method for successively generating an event to establish a total delay time that is greater than can be expressed by specified data bits in an event memory | Glen Gomes, James Alan Turnquist, Rochit Rajusman, Shigeru Sugamori | 2003-12-23 |
| 6594609 | Scan vector support for event based test system | Rochit Rajsuman | 2003-07-15 |
| 6578169 | Data failure memory compaction for semiconductor test system | Rochit Rajsuman, James Alan Turnquist, Shigeru Sugamori | 2003-06-10 |