Issued Patents 2003
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6668331 | Apparatus and method for successively generating an event to establish a total delay time that is greater than can be expressed by specified data bits in an event memory | Glen Gomes, Anthony Le, Rochit Rajusman, Shigeru Sugamori | 2003-12-23 |
| 6578169 | Data failure memory compaction for semiconductor test system | Anthony Le, Rochit Rajsuman, Shigeru Sugamori | 2003-06-10 |
| 6567941 | Event based test system storing pin calibration data in non-volatile memory | Rochit Rajsuman, Shigeru Sugamori | 2003-05-20 |
| 6557128 | Semiconductor test system supporting multiple virtual logic testers | — | 2003-04-29 |
| 6532561 | Event based semiconductor test system | Shigeru Sugamori, Rochit Rajsuman, Hiroaki Yamoto | 2003-03-11 |